X-Ray Diffraction Applications

Phase identification

Thin-film analysis
Lattice parameter determination
Purity/quality control of materials
Determination of crystallinity of polycrystalline materials
Stress analysis
Orientation of single crystals
Particle size determination

Wide Angle Diffraction

Microdiffraction
Small Angle Scattering
X-ray Reflectometry
Temperature Control (RT-1400 C)
High Resolution Thin Film Analysis
Pole Figure Analysis
Reciprocal Space Mapping